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Fundamentals of Secondary Ion Mass Spectrometry duration 53 minutes 44 seconds Fundamentals of Secondary Ion Mass Spectrometry Fundamentals of Secondary Ion Mass Spectrometry	Fundamentals of Secondary Ion Mass Spectrometry Presented by Jerry Hunter, WCNT Director, UW–MadisonSecondary Ion Mass Spectrometry offers analysis of inorganic and organic materials with ppm to ppb detection limits. Owing to its low… mrsec +3 More From KERRI PHILLIPS 0 likes 336 plays 0 Usage Rights None (All Rights Reserved)
New Capabilities in Nanoscale in situ X-Ray… duration 1 hour 6 minutes New Capabilities in Nanoscale in situ X-Ray… New Capabilities in Nanoscale in situ X-Ray Characterization	New Capabilities in Nanoscale in situ X-Ray Characterization Presented by Paul Evans, Professor of Materials Science and Engineering, UW-MadisonThis talk will focus on new opportunities available through the development of instrumentation bringing nanoscale… facilities +3 More From KERRI PHILLIPS 0 likes 30 plays 0
Introduction to XPS duration 58 minutes 30 seconds Introduction to XPS Introduction to XPS	Introduction to XPS Presented by Jerry Hunter, WCNT Director, UW–Madison facilities +3 More From KERRI PHILLIPS 0 likes 47 plays 0 Usage Rights None (All Rights Reserved)
$Thumbnail for Fundamentals of X-Ray Diffraction and Scattering$ Fundamentals of X-Ray Diffraction and Scattering duration 1 hour 7 minutes Fundamentals of X-Ray Diffraction and Scattering Fundamentals of X-Ray Diffraction and Scattering	Fundamentals of X-Ray Diffraction and Scattering Presented by Don Savage, WCNT, UW–MadisonThe tutorial will cover the basics of x-ray diffraction (XRD) and x-ray scattering. For XRD from polycrystalline materials, the focus will be on phase… amic +3 More From KERRI PHILLIPS 0 likes 180 plays 0 Usage Rights None (All Rights Reserved)
Introduction to Raman Spectroscopy and Imaging duration 59 minutes 12 seconds Introduction to Raman Spectroscopy and Imaging Introduction to Raman Spectroscopy and Imaging	Introduction to Raman Spectroscopy and Imaging Presented by David Tuschel, Raman Applications Scientist, HORIBA Scientific This tutorial will teach introductory Raman spectroscopy and imaging. The chemical bond origins of Raman scattering along… amic +3 More From KERRI PHILLIPS 0 likes 83 plays 0 Usage Rights None (All Rights Reserved)
Introduction to Transmission Electron Microscopy duration 1 hour 0 minutes Introduction to Transmission Electron Microscopy Introduction to Transmission Electron Microscopy	Introduction to Transmission Electron Microscopy Presented by Paul Voyles, Wisconsin MRSEC Director and Professor of Materials Science and Engineering, UW–MadisonWhat if we could know everything there was to know about the structure of a… amic +3 More From KERRI PHILLIPS 0 likes 34 plays 0 Usage Rights None (All Rights Reserved)
$Thumbnail for Introduction to Electron Backscattered Diffraction and Energy Dispersive X-Ray Microanalysis$ Introduction to Electron Backscattered… duration 1 hour 26 minutes Introduction to Electron Backscattered… Introduction to Electron Backscattered Diffraction and Energy Dispersive X-Ray Microanalysis	Introduction to Electron Backscattered Diffraction and Energy Dispersive X-Ray Microanalysis Presented by Chris Stephens of Thermo-Fisher Scientific. Project Highlights presented by: Mohamed Elbakhshwan, Assistant Scientist in Engineering Physics Dongzheng Chen, Graduate Student in… amic +3 More From KERRI PHILLIPS 0 likes 30 plays 0 Usage Rights None (All Rights Reserved)
Measuring Nanoscale Mechanical Properties:… duration 57 minutes 43 seconds Measuring Nanoscale Mechanical Properties:… Measuring Nanoscale Mechanical Properties: Nanoindentation and AFM Indentation Techniques	Measuring Nanoscale Mechanical Properties: Nanoindentation and AFM Indentation Techniques Presented by Julie Morasch, AMIC Director and WCNT Instrument ManagerMeasuring the mechanical properties of materials at the nanoscale allows determination of local mechanical properties as well as… facilities +3 More From KERRI PHILLIPS 0 likes 190 plays 0 Usage Rights None (All Rights Reserved)
Atomic Force Microscopy - Overview and Recent… duration 1 hour 12 minutes Atomic Force Microscopy - Overview and Recent… Atomic Force Microscopy - Overview and Recent Developments	Atomic Force Microscopy - Overview and Recent Developments Presented by John Thornton, Senior Applications Engineer, Bruker Nano SurfacesThe field of Atomic Force Microscopy (AFM) encompasses a variety of techniques that provide the ability to visualize and… facilities +3 More From KERRI PHILLIPS 0 likes 47 plays 0 Usage Rights None (All Rights Reserved)
Introduction to Focused Ion Beam duration 57 minutes 17 seconds Introduction to Focused Ion Beam Introduction to Focused Ion Beam	Introduction to Focused Ion Beam Presented by Rick Passey, Thermo-Fisher ScientificThe Focused Ion Beam/Scanning Electron Microscopy technique has been widely adopted by the materials science and biological communities because it… facilities +3 More From KERRI PHILLIPS 0 likes 79 plays 0 Usage Rights None (All Rights Reserved)
Direct Electron Detectors for Materials Science… duration 57 minutes 52 seconds Direct Electron Detectors for Materials Science… Direct Electron Detectors for Materials Science Applications 2020-10-13	Direct Electron Detectors for Materials Science Applications 2020-10-13 Presented by Barnaby Levin, Applications Scientist, Direct ElectronProject Highlights presented by:Chenyu Zhang, UW–Madison, Materials Science and Engineering Carter Francis, UW–Madison,… facilities +3 More From KERRI PHILLIPS 0 likes 18 plays 0 Usage Rights None (All Rights Reserved)
2020 Facilities Days Open House Overview and… duration 44 minutes 42 seconds 2020 Facilities Days Open House Overview and… 2020 Facilities Days Open House Overview and What's New at the WCNT	2020 Facilities Days Open House Overview and What's New at the WCNT This presentation introduces the Wisconsin Centers for Nanoscale Technology and then covers the range of techniques available and discusses learning objectives for the webinar series. A broad outline… wcnt +3 More From KERRI PHILLIPS 0 likes 37 plays 0 Usage Rights None (All Rights Reserved)
Facilities Days - Introduction to SEM 2020-10-08 duration 1 hour 11 minutes Facilities Days - Introduction to SEM 2020-10-08 Facilities Days - Introduction to SEM 2020-10-08	Facilities Days - Introduction to SEM 2020-10-08 The Field-Emission Scanning Electron Microscope (FESEM) imaging and analysis capabilities were explored. FESEMs are used when application analysis requires single-nanometer resolution for surface… facilities +3 More From KERRI PHILLIPS 0 likes 80 plays 0 Usage Rights None (All Rights Reserved)