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Facilities Days - Introduction to SEM 2020-10-08

From KERRI PHILLIPS October 10th, 2020

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2020 Facilities Days Open House Overview and…

37 | duration 44 minutes 42 seconds

2020 Facilities Days Open House Overview and…

2020 Facilities Days Open House Overview and What's New at the WCNT

From KERRI PHILLIPS October 10th, 2020

Direct Electron Detectors for Materials Science…

18 | duration 57 minutes 52 seconds

Direct Electron Detectors for Materials Science…

Direct Electron Detectors for Materials Science Applications 2020-10-13

From KERRI PHILLIPS October 22nd, 2020

Introduction to Focused Ion Beam

81 | duration 57 minutes 17 seconds

Introduction to Focused Ion Beam

From KERRI PHILLIPS October 22nd, 2020

Atomic Force Microscopy - Overview and Recent…

53 | duration 1 hour 12 minutes

Atomic Force Microscopy - Overview and Recent…

Atomic Force Microscopy - Overview and Recent Developments

From KERRI PHILLIPS October 22nd, 2020

Measuring Nanoscale Mechanical Properties:…

196 | duration 57 minutes 43 seconds

Measuring Nanoscale Mechanical Properties:…

Measuring Nanoscale Mechanical Properties: Nanoindentation and AFM Indentation Techniques

From KERRI PHILLIPS October 22nd, 2020

$Thumbnail for Introduction to Electron Backscattered Diffraction and Energy Dispersive X-Ray Microanalysis$

Introduction to Electron Backscattered…

30 | duration 1 hour 26 minutes

Introduction to Electron Backscattered…

Introduction to Electron Backscattered Diffraction and Energy Dispersive X-Ray Microanalysis

From KERRI PHILLIPS November 5th, 2020

Introduction to Transmission Electron Microscopy

34 | duration 1 hour 0 minutes

Introduction to Transmission Electron Microscopy

From KERRI PHILLIPS November 5th, 2020

Introduction to Raman Spectroscopy and Imaging

103 | duration 59 minutes 12 seconds

Introduction to Raman Spectroscopy and Imaging

From KERRI PHILLIPS November 5th, 2020

$Thumbnail for Fundamentals of X-Ray Diffraction and Scattering$

Fundamentals of X-Ray Diffraction and Scattering

193 | duration 1 hour 7 minutes

Fundamentals of X-Ray Diffraction and Scattering

From KERRI PHILLIPS November 5th, 2020

Introduction to XPS

54 | duration 58 minutes 30 seconds

Introduction to XPS

From KERRI PHILLIPS November 16th, 2020

The Field-Emission Scanning Electron Microscope (FESEM) imaging and analysis capabilities were explored. FESEMs are used when application analysis requires single-nanometer resolution for surface examination.

The discussion started with a basic FESEM overview, reviewing the major physical scanning microscope components, such as the electron column, specimen chamber, workstation and detectors (including x-ray spectroscopy). This overview includes diagrams of the major vacuum components in the electron beam column and the specimen chamber. Next, the various detectors, chamber cameras, sample stage specifications and sample mounting techniques were be discussed. Additionally, applications for both materials science (metals, composites and polymers) and life science (animal and plant) were examined.

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Facilities Days - Introduction to SEM 2020-10-08

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