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Presented by Jerry Hunter, WCNT Director, UW–MadisonSecondary Ion Mass Spectrometry offers analysis of inorganic and organic materials with ppm to ppb detection limits. Owing to its low…
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Presented by Paul Evans, Professor of Materials Science and Engineering, UW-MadisonThis talk will focus on new opportunities available through the development of instrumentation bringing nanoscale…
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Presented by Jerry Hunter, WCNT Director, UW–Madison
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Presented by Don Savage, WCNT, UW–MadisonThe tutorial will cover the basics of x-ray diffraction (XRD) and x-ray scattering. For XRD from polycrystalline materials, the focus will be on phase…
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Presented by David Tuschel, Raman Applications Scientist, HORIBA Scientific This tutorial will teach introductory Raman spectroscopy and imaging. The chemical bond origins of Raman scattering along…
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Presented by Paul Voyles, Wisconsin MRSEC Director and Professor of Materials Science and Engineering, UW–MadisonWhat if we could know everything there was to know about the structure of a…
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Presented by Chris Stephens of Thermo-Fisher Scientific. Project Highlights presented by: Mohamed Elbakhshwan, Assistant Scientist in Engineering Physics Dongzheng Chen, Graduate Student in…
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Presented by Julie Morasch, AMIC Director and WCNT Instrument ManagerMeasuring the mechanical properties of materials at the nanoscale allows determination of local mechanical properties as well as…
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Presented by John Thornton, Senior Applications Engineer, Bruker Nano SurfacesThe field of Atomic Force Microscopy (AFM) encompasses a variety of techniques that provide the ability to visualize and…
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Presented by Rick Passey, Thermo-Fisher ScientificThe Focused Ion Beam/Scanning Electron Microscopy technique has been widely adopted by the materials science and biological communities because it…
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Presented by Barnaby Levin, Applications Scientist, Direct ElectronProject Highlights presented by:Chenyu Zhang, UW–Madison, Materials Science and Engineering Carter Francis, UW–Madison,…
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This presentation introduces the Wisconsin Centers for Nanoscale Technology and then covers the range of techniques available and discusses learning objectives for the webinar series. A broad outline…
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The Field-Emission Scanning Electron Microscope (FESEM) imaging and analysis capabilities were explored. FESEMs are used when application analysis requires single-nanometer resolution for surface…
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